Kontakt
Ako nakupovať
Doručenie
Nákupný poradca
Semiconductor Memory Testing
Fault Models and Test Considerations for High Performance Embedded SRAM's
Angličtina
121 b
30 dní na vrátenie tovaru
Zákazníci tiež kúpili
Stringent test quality requirements, at-speed test limitations & total cost associated with using expensive off-chip testers for embedded memory testing have forced system designers to introduce on-chip Memory Built-in Self Test (MBIST) techniques to generate, apply, read and compares test patterns in order to expose subtle defects of SRAM''s. The book discusses in detail the various fault models and test requirements associated with embedded SRAM s in today s System-On-Chip s and focuses on the implementation of testing algorithms for embedded SRAMs in the MBIST engine. The book also discusses a finding where failure analysis and silicon debug required an update to the algorithms and pattern backgrounds implemented in the MBIST.
Informácie o knihe
Angličtina
Darujte túto knihu ešte dnes
Je to jednoduché
1 Pridajte knihu do košíka a vyberte možnosť doručiť ako darček 2 Obratom Vám zašleme poukaz 3 Knihu zašleme na adresu obdarovanéhoMohlo by vás tiež zaujímať
/
Pevná
98.13
€
/
Brožovaná
51.69
€
/
Pevná
236.95
€
/
Brožovaná
51.69
€
