Nehodí sa? Žiadny problém! U nás môžete do 30 dní vrátiť
S darčekovým poukazom nešliapnete vedľa. Obdarovaný si za darčekový poukaz môže vybrať čokoľvek z našej ponuky.
30 dní na vrátenie tovaru
Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical aspects. Numerous topics are organized under two sections, "Material Science" and "Nanostructured Materials for Electronic Industry". This book includes contributions by renowned researchers and experts in this field.
Ahoj! Som Libroamiko, tvoj knižný radca.
Ako ti môžem pomôcť?