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VLSI Design and Test

Name: VLSI Design and Test
Brand: Springer
SKU: 41337477
Price: 121.0 EUR
Availability: InStock
Author: S. Rajaram
ISBN: 9789811359507

22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

S. Rajaram

N.B. Balamurugan

D. Gracia Nirmala Rani

Virendra Singh

Jazyk

Angličtina

E-kniha Adobe ePub DRM

Libristo kód: 41337477

Nakladateľstvo Springer, január 2019

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design an... Celý popis

Libristo kód: 41337477

292 b

121.00 €

Skladom Ihneď na stiahnutie

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.