Doprava zdarma pre objednávky nad 59,99 € s Packetou a SPS Boxmi.

Zistiť stav objednávky

Staňte sa súčasťou komunity milovníkov kníh z celého sveta a získajte hromadu výhod. Založiť účet zdarma

Doprava zadarmo s Packetou nad 59.99 €

Kuriér DPD 2.99 € Kuriér GLS 3.99 € Zberné miesto GLS 2.49 € SPS 3.99 € SPS Parcel Shop 2.99 € Packeta kurýr 3.99 € Slovenská pošta 3.99 € Zberné miesto DPD 2.99 € Packeta 2.99 €

Kontakt

Ako nakupovať

Pomoc

Môj účet

▸ Prázdny :-(

Doprava zdarma pre objednávky nad 59,99 € s Packetou a SPS Boxmi.

Field Emission Scanning Electron Microscopy

Name: Field Emission Scanning Electron Microscopy
Brand: Springer
SKU: 41332823
Price: 81.02 EUR
Availability: InStock
Author: Nicolas Brodusch
ISBN: 9789811044335

New Perspectives for Materials Characterization

Nicolas Brodusch

Hendrix Demers

Raynald Gauvin

Jazyk

Angličtina

E-kniha Adobe ePub DRM

Libristo kód: 41332823

Nakladateľstvo Springer, september 2017

This book highlights what is now achievable in terms of materials characterization with the new gene... Celý popis

Libristo kód: 41332823

196 b

81.02 €

Skladom Ihneď na stiahnutie

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage